• Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decomposition 

      Gocłowski, Paweł; Trusiak, Maciej; Ahmad, Azeem; Styk, Adam; Mico, Vicente; Ahluwalia, Balpreet Singh; Patorski, Krzysztof (Journal article; Tidsskriftartikkel; Peer reviewed, 2020-02-19)
      Fringe patterns encode the information about the result of a measurement performed via widely used optical full-field testing methods, e.g., interferometry, digital holographic microscopy, moiré techniques, structured illumination etc. Affected by the optical setup, changing environment and the sample itself fringe patterns are often corrupted with substantial noise, strong and uneven background ...